Friction force microscopy
نویسندگان
چکیده
منابع مشابه
High-resolution friction force microscopy under electrochemical control.
We report the design and development of a friction force microscope for high-resolution studies in electrochemical environments. The design choices are motivated by the experimental requirements of atomic-scale friction measurements in liquids. The noise of the system is analyzed based on a methodology for the quantification of all the noise sources. The quantitative contribution of each noise ...
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The scan-velocity dependence of friction force microscopy (FFM) is characterized on gelatin films and related to the rate dependence of molecular relaxations. For selected scanning-parameter values the velocity dependence of frictional force is affected by the measurement process, because of energy imparted to the tip-sample contact region: a peak in the friction-velocity relationship, attribut...
متن کاملVelocity dependent friction laws in contact mode atomic force microscopy.
Friction forces in the tip-sample contact govern the dynamics of contact mode atomic force microscopy. In ambient conditions typical contact radii between tip and sample are in the order of a few nanometers. In order to account for the large interaction area the dynamics of contact mode atomic force microscope (AFM) is investigated under the assumption of a multi-asperity contact interface betw...
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A method for sensing the dissipation occurring when a sharp atomic force microscopy (AFM) tip is oscillated laterally above a surface at distances typical of non-contact mode AFM operation is established and demonstrated. Dissipation is detected by measuring the damping of lateral resonant modes of the AFM cantilever, excited independently after the lateral resonant mode identification, when th...
متن کاملCompositional mapping of semiconductor structures by friction force microscopy
Topographic and chemical mapping of materials at high resolution define the goals of a microscope. Force microscopy can provide methods for simultaneous topography and chemical characterization of materials. Here we describe the use of the atomic force microscope to map chemical variations of semiconductor samples. Chemical maps of semiconductor InP/InGaAs alloys have been determined with 3 nm ...
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ژورنال
عنوان ژورنال: Materials Today
سال: 2005
ISSN: 1369-7021
DOI: 10.1016/s1369-7021(05)00845-x